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Stock Photo: Manual probe system with needles for test of semiconductor on silicon wafer. Selective focus.

Item number : 69064755 See all

This Stock Photo, whose title is "Manual probe system with needles for test of..."[69064755], includes tags of circuit, board, chip. The author of this item is Anatoly Morozov (No.814472). Sizes from S to XL are available and the price starts from US$5.00. You can download watermarked sample data (comp images), check the quality of images, and use Lightbox after signing up for free. See all

Manual probe system with needles for test of semiconductor on silicon wafer. Selective focus. 69064755

Manual probe system with needles for test of semiconductor on silicon wafer. Selective focus.

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S
  • 640 x 426px
  • 22.6 x 15.0cm (72dpi)
 JPG US$5.00
M
  • 2000 x 1333px
  • 16.9 x 11.3cm (300dpi)
 JPG US$15.00
L
  • 4000 x 2667px
  • 33.9 x 22.6cm (300dpi)
 JPG US$30.00
XL
  • 4818 x 3213px
  • 40.8 x 27.2cm (300dpi)
 JPG US$50.00
Ex Add an Extended License +US$30.00
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Stock Photo: Manual probe system with needles for test of semiconductor on silicon wafer. Selective focus. tags

circuit　 board　 chip　 semiconductor　 station　 probe　 wafer　 testing　 electronics　 equipment　 industry　 computer　 lab　 electronic　 test　 measurement　 manufacturing　 microscope　 silicon　 production　 technology　 electrical　 machine　 laboratory　 needle　 processor　 quality　 digital　 system　 cpu　 contact　 connect　 circle　 crystal　 sensor　 tips　 voltage　 micro　 material　 transistor　 process　 prober　 die　 disk　 cmos　 pad　
Description / Comment
Checking microchips on silicon wafer with probe station.Close up . Semiconductor Crystal Manufacturing.Selective focus.
checking money held in a human hand . Euro currency in UV light protection [69064754] Manual probe system with needles for test of semiconductor on silicon wafer. Selective focus. [69064756]

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