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Stock Photo: semiconductor silicon wafer defect inspection

Item number : 110369376 See all

This Stock Photo, whose title is "semiconductor silicon wafer defect inspection"[110369376], includes tags of microscope, test, chip. The author of this item is genkur (No.662247). Sizes from S to XL are available and the price starts from US$5.00. You can download watermarked sample data (comp images), check the quality of images, and use Lightbox after signing up for free. See all

semiconductor silicon wafer defect inspection 110369376

semiconductor silicon wafer defect inspection

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  • 15.0 x 22.6cm (72dpi)
JPG US$5.00
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Semiconductor silicon wafer defect inspection. Automated optical inspection equipment for semiconductor silicon wafer defects detection. Selective focus.